JIS C 5402-11-3:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment -- Tests and measurements -- Part 11-3: Climatic tests -- Test 11c: Damp heat, steady state Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
English
20-03-2005
This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function in a specified manner under conditions of high relative humidity. This test may also be used for similar devices when specified in a detail specification.
| DocumentType |
Standard
|
| Pages |
3
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-11-3:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 5402-2-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests -- Test 2a : Contact resistance -- Millivolt level method Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method |
| JIS C 5402-1-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 1-1: General examination -- Test 1a: Visual examination |
| JIS C 5402-3-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
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