JIS K 0147-2:2017
Current
Current
The latest, up-to-date edition.
Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
Published date
21-08-2017
Publisher
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| ISO 18115-2:2013 | Identical |
2017 [21/08/2017]
| JIS K 0199:2023 | Guideline for alignment procedure for identical location analysis between different microscopic measuring instruments |
| JIS K 0182:2023 | Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants |
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