JIS K 0199:2023
Current
Current
The latest, up-to-date edition.
Guideline for alignment procedure for identical location analysis between different microscopic measuring instruments
Published date
20-01-2023
Publisher
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| JIS K 0147-1:2017 | Surface chemical analysis -- Vocabulary -- Part 1: General terms and terms used in spectroscopy |
| JIS K 0147-2:2017 | Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy |
Summarise
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