NBN EN 60749-27 : 2007 AMD 1 2012

1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
   4.1 MM ESD waveform generator
   4.2 Waveform verification equipment
5 MM current waveform requirements
   5.1 General
   5.2 Waveform qualification and verification
6 Device specific evaluation considerations
   6.1 Sample size and test conditions
   6.2 Worst-case pin or standard qualification board
7 Classification procedure
   7.1 Device requirements
   7.2 Device selection
   7.3 Device characterization
   7.4 Device stress levels
   7.5 Pin combinations
   7.6 Order of test
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) Normative references to international
                     publications with their corresponding
                     European publications

Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).