BS EN 60749-27 : 2006
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
Hardcopy , PDF
English
01-01-2006
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
5 MM current waveform requirements
6 Device specific evaluation considerations
7 Classification procedure
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) - Normative references to international
publications with their corresponding European
publications
Describes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD).
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS EN 60749. (09/2006) Supersedes 05/30128292 DC (10/2006) 2006 Edition Re-Issued in January 2013 & incorporates AMD 1 2012 Supersedes 11/30252690 DC. (02/2013)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| I.S. EN 60749-27:2006 | Identical |
| NF EN 60749-27 : 2006 AMD 1 2013 | Identical |
| NBN EN 60749-27 : 2007 AMD 1 2012 | Identical |
| IEC 60749-27:2006+AMD1:2012 CSV | Identical |
| DIN EN 60749-27:2013-04 | Identical |
| EN 60749-27:2006 | Equivalent |
| UNE-EN 60749-27:2006 | Equivalent |
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