Name: NEN EN IEC 62415 : 2010 - SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Brand: Netherlands Standards

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SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST

Published date

12-01-2013

Publisher

Netherlands Standards

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Specifies a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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NEN EN IEC 62415 : 2010