EN 62415:2010
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Constant current electromigration test
Published date
04-06-2010
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FOREWORD
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 62415 : 2010 | Identical |
| IEC 62415:2010 | Identical |
| NBN EN 62415 : 2010 | Identical |
| NEN EN IEC 62415 : 2010 | Identical |
| I.S. EN 62415:2010 | Identical |
| PN EN 62415 : 2010 | Identical |
| BS EN 62415:2010 | Identical |
| CEI EN 62415 : 2011 | Identical |
| DIN EN 62415:2010-12 | Identical |
| UNE-EN 62415:2010 | Identical |
Summarise
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