NF EN 60749-29 : 2012
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Published date
12-01-2013
Publisher
| DevelopmentNote |
Indice de classement: C96-022-29. (05/2004) PR NF EN 60749-29 March 2011. (03/2011)
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| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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