UNE-EN 60749-5:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
Hardcopy , PDF
English
01-08-2017
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for thepurpose of evaluating the reliability of non-hermetic packaged solid-state devices in humidenvironments. .This test method is considered destructive.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4171-4
|
| Pages |
19
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60749-5:2017 | Equivalent |
| I.S. EN 60749-5:2017 | Equivalent |
| EN 60749-5:2017 | Identical |
| IEC 60749-5:2017 | Identical |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.