• Shopping Cart
    There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

BS EN 60749-5:2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

20-07-2017

Superseded date

06-02-2024

Superseded by

BS EN IEC 60749-5:2024

£166.00
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Equipment
6 Test conditions
7 Procedures
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Defines a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203277 DC (10/2004) Supersedes BS EN 60749. (09/2005) Supersedes 16/30348576 DC. (07/2017)
DocumentType
Standard
Pages
18
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

This part of IEC60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This test method is considered destructive.

Standards Relationship
NF EN 60749-5 : 2003 Identical
IEC 60749-5:2017 Identical
NBN EN 60749-5 : 2004 Identical
DIN EN 60749-5:2003-09 Identical
EN 60335-2-9:2003/A13:2010/AC:2011 Identical
EN 60749-5:2017 Identical
I.S. EN 60749-5:2017 Identical
UNE-EN 60749-5:2017 Equivalent
UNE-EN 60749-5:2003 Identical

EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

£166.00
Excluding VAT