UNE-EN 62047-11:2013
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (Endorsed by AENOR in November of 2013.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-11-2013
Publisher
£59.01
Excluding VAT
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
23
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 62047-11:2013 | Equivalent |
| BS EN 62047-11:2013 | Equivalent |
| EN 62047-11:2013 | Identical |
| IEC 62047-11:2013 | Identical |
Summarise
£59.01
Excluding VAT
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