17/30343628 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE
Hardcopy , PDF
English
31-03-2018
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Principle
5 Equipment
6 Specimens
7 Reference materials
8 Experimental procedure
9 Measurement and solution of the SAED patterns
10 The 180 degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing of pure
Au and Al
Annex B (informative) - Spot diffraction patterns of
single crystals with body-centred cubic (BCC,
face-centred cubic (FCC) and hexagonal close
packed (HCP) structure
Bibliography
BS ISO 25498.
| Committee |
CII/9
|
| DocumentType |
Draft
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 15932:2013 | Microbeam analysis — Analytical electron microscopy — Vocabulary |
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