BS ISO 25498:2010
Current
The latest, up-to-date edition.
Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
Hardcopy , PDF
English
30-06-2010
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Reference materials
6 Equipment
7 Specimens
8 Experimental procedure
9 Measurement and solution of the SAED patterns
10 180 Degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing
Annex B (informative) - Spot diffraction patterns
of single crystals for BCC, FCC and HCP
structure
Bibliography
Defines the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size.
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 17/30343628 DC. (03/2018)
|
| DocumentType |
Standard
|
| Pages |
40
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| ISO 25498:2010 | Identical |
| ISO 25498:2018 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 15932:2013 | Microbeam analysis — Analytical electron microscopy — Vocabulary |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.