• Shopping Cart
    There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

BS EN 60749-35:2006

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-11-2006

£232.00
Excluding VAT

1 Scope
2 Terms and definitions
3 Test apparatus
  3.1 Reflective acoustic microscope system
  3.2 Through transmission acoustic microscope system
  3.3 Reference packages or standards
  3.4 Sample holder
4 Procedure
  4.1 General
  4.2 Equipment setup
  4.3 Performance of acoustic scans
Annex A (informative) Acoustic microscopy check sheet
        (example only - not a mandatory template)
Annex B (informative) Potential image pitfalls
Annex C (informative) Some limitations of acoustic microscopy
Annex D (informative) Reference checklist for presenting
        applicable scanned data
Bibliography

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components.

Committee
EPL/47
DevelopmentNote
Supersedes 04/30117780 DC (12/2006)
DocumentType
Standard
Pages
24
PublisherName
British Standards Institution
Status
Current
Supersedes

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Standards Relationship
DIN EN 60749-35:2007-03 Identical
I.S. EN 60749-35:2006 Identical
IEC 60749-35:2006 Identical
NF EN 60749-35 : 2006 Identical
EN 61140:2002 Identical
NBN EN 60749-35 : 2007 Identical
EN 60749-35:2006 Identical
UNE-EN 60749-35:2006 Equivalent

IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
EN 60749-20:2009 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

£232.00
Excluding VAT