IEEE C62.35-2010
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
20-10-2021
English
31-08-2010
1. Scope
2. Definitions
3. V-I Characteristics for a unidirectional ABD
4. Circuit symbols
5. Service conditions
6. Standard design test procedures
7. Failures and fault modes
8. Derived parameters and other test procedures
Annex A (informative) - Bibliography
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