ISO 22493:2014
Current
The latest, up-to-date edition.
Microbeam analysis — Scanning electron microscopy — Vocabulary
Hardcopy , PDF
English
09-04-2014
ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
| Committee |
ISO/TC 202/SC 1
|
| DevelopmentNote |
Supersedes ISO/DIS 22493. (04/2014)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS ISO 22493:2014 | Identical |
| NF ISO 22493 : 2009 | Identical |
| ISO/TR 19319:2013 | Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods |
| ISO/TS 10798:2011 | Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis |
| 13/30290864 DC : 0 | BS EN 16691 - WATER QUALITY - DETERMINATION OF POLYCYCLIC AROMATIC HYDROCARBONS (PAH) IN WHOLE WATER SAMPLES USING LIQUID SOLID EXTRACTION COMBINED WITH GAS CHROMATOGRAPHY MASS SPECTROMETRY (GC-MS) |
| 16/30319120 DC : 0 | BS ISO 20263 - MICROBEAM ANALYSIS - ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY - DETERMINATION METHOD FOR INTERFACE POSITION IN THE CROSS-SECTIONAL IMAGE OF THE LAYERED MATERIALS |
| ISO/TS 24597:2011 | Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness |
| DD ISO/TS 10798 : DRAFT JULY 2011 | NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS |
| BS ISO 15932:2013 | Microbeam analysis. Analytical electron microscopy. Vocabulary |
| 17/30328207 DC : DRAFT SEP 2017 | BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS |
| PD ISO/TS 10797:2012 | Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy |
| PD ISO/TR 19319:2013 | Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO 15932:2013 | Microbeam analysis — Analytical electron microscopy — Vocabulary |
| ISO/TS 10797:2012 | Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy |
| 12/30245653 DC : 0 | BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY |
| XP ISO/TS 24597 : 2011 XP | MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - METHODS OF EVALUATING IMAGE SHARPNESS |
| FD T16 203 : 2011 FD | NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLE-WALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| ISO 10241:1992 | International terminology standards — Preparation and layout |
| ISO 1087-1:2000 | Terminology work — Vocabulary — Part 1: Theory and application |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 704:2009 | Terminology work — Principles and methods |
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