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ISO/TS 10798:2011

Current

Current

The latest, up-to-date edition.

Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Available format(s)

Hardcopy , PDF

Language(s)

French, English

Published date

14-07-2011

£126.00
Excluding VAT

ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).

Committee
ISO/TC 229
DocumentType
Technical Specification
Pages
28
PublisherName
International Organization for Standardization
Status
Current

ISO/TS 13278:2017 Nanotechnologies — Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
DD ISO/TS 13278:2011 Nanotechnologies. Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
PD ISO/TS 13278:2017 Nanotechnologies. Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
PD ISO/TR 19601:2017 Nanotechnologies. Aerosol generation for air exposure studies of nano-objects and their aggregates and agglomerates (NOAA)
PD ISO/TR 10929:2012 Nanotechnologies. Characterization of multiwall carbon nanotube (MWCNT) samples
ISO/TR 19601:2017 Nanotechnologies — Aerosol generation for air exposure studies of nano-objects and their aggregates and agglomerates (NOAA)
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
ISO/TR 10929:2012 Nanotechnologies — Characterization of multiwall carbon nanotube (MWCNT) samples
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ISO/TS 10797:2012 Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy
PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects

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ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
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ISO 14595:2014 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above

£126.00
Excluding VAT