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PD ISO/TS 10797:2012

Current

Current

The latest, up-to-date edition.

Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-06-2012

£272.00
Excluding VAT

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles
5 Sample preparation
6 Measurement procedures
7 Data analysis, interpretation and reporting of
  results
Annex A (informative) - Case studies
Annex B (informative) - Additional information on
        sample preparation and experimental procedures
Annex C (informative) - Additional information on
        observation of SWCNTs
Annex D (informative) - Additional information on
        factors influencing the observation of SWCNTs
Bibliography

Provides methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive X-ray spectrometry.

Committee
NTI/1
DocumentType
Standard
Pages
42
PublisherName
British Standards Institution
Status
Current

This Technical Specification establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive X-ray spectrometry.

Standards Relationship
ISO/TS 10797:2012 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
ISO/TS 80004-3:2010 Nanotechnologies — Vocabulary — Part 3: Carbon nano-objects
ISO 22493:2014 Microbeam analysis — Scanning electron microscopy — Vocabulary
ISO 13794:1999 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
ISO 29301:2010 Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
ISO/TR 10929:2012 Nanotechnologies — Characterization of multiwall carbon nanotube (MWCNT) samples
ISO/TS 27687:2008 Nanotechnologies — Terminology and definitions for nano-objects — Nanoparticle, nanofibre and nanoplate
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 13322-1:2014 Particle size analysis — Image analysis methods — Part 1: Static image analysis methods
ISO/TR 12885:2008 Nanotechnologies — Health and safety practices in occupational settings relevant to nanotechnologies
ISO 14595:2014 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above

£272.00
Excluding VAT