UNE-EN 60749-20:2004
Superseded
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
Available format(s)
Hardcopy , PDF
Language(s)
Spanish, Castilian, English
Published date
06-11-2004
Publisher
Superseded date
10-06-2023
Superseded by
US$97.16
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS EN 60749-20:2009 | Identical |
| DIN EN 60749-20:2010-04 | Identical |
| IEC 60749-20:2008 | Identical |
| NBN EN 60749-20 : 2010 | Identical |
| EN 60749-20:2003 | Identical |
| EN 60749-20:2009 | Identical |
| NF EN 60749-20 : 2010 | Identical |
| I.S. EN 60749-20:2009 | Identical |
| IEC 60749-20:2002 | Identical |
Summarise
US$97.16
Excluding Tax where applicable
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