15/30317578 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS ISO 16700 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION
Hardcopy , PDF
English
31-07-2016
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Image magnification
5 Reference material
6 Calibration procedures
7 Accuracy of image magnification and scale marker
8 Calibration report
Annex A (informative) - Reference materials for magnification
Annex B (informative) - Parameters that influence the
resultant magnification of an SEM
Annex C (informative) - Uncertainties in magnification
measurements
Annex D (informative) - Example of a test report
Bibliography
BS ISO 16700.
| Committee |
CII/9
|
| DocumentType |
Draft
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
| ISO Guide 35:2017 | Reference materials — Guidance for characterization and assessment of homogeneity and stability |
| ISO Guide 30:2015 | Reference materials — Selected terms and definitions |
| ISO Guide 34:2009 | General requirements for the competence of reference material producers |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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