MIL-STD-105 Revision E:1989

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1 Scope
1.1 Purpose
1.2 Application
2 Referenced documents
2.1 Not applicable
3 Definitions
3.1 Acceptable quality level (AQL)
3.2 Average outgoing quality (AOQ)
3.3 Average outgoing quality limit (AOQL)
3.4 Classification of defects
3.5 Critical defect
3.6 Critical defective
3.7 Defect
3.8 Defective
3.9 Defects per hundred units
3.10 Inspection
3.11 Inspection by attributes
3.12 Lot or batch
3.13 Lot or batch size
3.14 Major defect
3.15 Major defective
3.16 Minor defect
3.17 Minor defective
3.18 Percent defective
3.19 Process average
3.20 Sample
3.21 Sample size code letter
3.22 Sampling plan
3.23 Unit of production
4 General requirements
4.1 Written procedures
4.2 Nonconformance
4.3 Formation and identification of lots or
          batches
4.4 AQL
4.4.1 AQL use
4.4.2 Limitation
4.4.3 Choosing AQLs
4.5 Sampling
4.5.1 Representative sampling
4.5.2 Time of sampling
4.5.3 Double or multiple sampling
4.6 Inspection procedures
4.7 Switching procedures
4.7.1 Normal to tightened
4.7.2 Tightened to normal
4.7.3 Normal to reduced
4.7.4 Reduced to normal
4.8 Discontinuation of inspection
4.9 Sampling plans
4.9.1 Inspection level
4.9.2 Code letters
4.9.3 Obtaining sampling plan
4.9.4 Types of sampling plans
4.10 Determination of acceptability
4.10.1 Percent defective inspection
4.10.1.1 Single sampling plan
4.10.1.2 Double sampling plan
4.10.1.3 Multiple sampling plan
4.10.1.4 Special procedure for reduced inspection
4.10.2 Defects per hundred units inspection
4.11 Limiting quality protection
4.12 Curves
4.12.1 Operating characteristic curves
4.12.2 Average sample size curves
5 Tables
Table
I Sample size code letters
II-A Single sampling plans for normal inspection
       (master table)
II-B Single sampling plans for tightened inspection
       (master table)
II-C Single sampling plans for reduced inspection
       (master table)
III-A Double sampling plans for normal inspection
       (master table)
III-B Double sampling plans for tightened inspection
       (master table)
III-C Double sampling plans for reduced inspection
       (master table)
IV-A Multiple sampling plans for normal inspection
       (master table)
IV-B Multiple sampling plans for tightened inspection
       (master table)
IV-C Multiple sampling plans for reduced inspection
       (master table)
V-A Average outgoing quality limit factors for normal
       inspection (single sampling)
V-B Average outgoing quality limit factors for
       tightened inspection (single sampling)
VI-A Limiting quality (in percent defective) for which
       a Pa = 10% (for normal inspection, single
       sampling)
VI-B Limiting quality (in defects per hundred units)
       for which the Pa = 10% (for normal inspection,
       single sampling)
VII-A Limiting quality (in percent defective) for which
       the Pa = 5% (for normal inspection, single
       sampling)
VII-B Limiting quality (in defects per hundred units)
       For which the Pa = 5% (for normal inspection,
       single sampling)
VIII Limit numbers for reduced inspection
IX Average sample size curves for double and
       multiple sampling
Sampling plans and operating characteristics curves
(and data) for:
X-A Sample size code letter A
X-B Sample size code letter B
X-C Sample size code letter C
X-D Sample size code letter D
X-E Sample size code letter E
X-F Sample size code letter F
X-G Sample size code letter G
X-H Sample size code letter H
X-J Sample size code letter J
X-K Sample size code letter K
X-L Sample size code letter L
X-M Sample size code letter M
X-N Sample size code letter N
X-P Sample size code letter P
X-Q Sample size code letter Q
X-R Sample size code letter R
X-S Sample size code letter S
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6 Notes
6.1 Intended use
6.2 Subject term (key word) listing
6.3 Changes from previous issue
Concluding material